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Reliability Characterization and Activity Analysis of lowRISC Internal Modules against Single Event Upsets Using Fault Injection and RTL Simulation
Universidad Antonio de Nebrija, Spain.ORCID iD: 0000-0002-3297-0189
Universidad Carlos III de Madrid, Spain.
2019 (English)In: Microprocessors and microsystems, ISSN 0141-9331, E-ISSN 1872-9436, Vol. 71, article id 102871Article in journal (Other academic) Published
Abstract [en]

One of the concerns about satellites with sensitive electronic devices is the harmful radiation that produces effects like Single Event Upsets (SEUs), which can cause errors. SRAM-based FPGAs are extensively used to implement a wide range of digital circuits among which are soft processors. In this paper, we focus on two different issues: 1) characterizing the different modules of lowRISC to determine their sensitivity to errors in the FPGA configuration memory and 2) analyzing the activity level of the mentioned modules using RTL simulation to correlate the activity level and the sensitivity of the different modules of the soft processor. Fault injection campaigns have been performed in order to evaluate the reliability of these different modules. Experimental results show that the instruction cache module is the most sensitive module of lowRISC for the benchmarks considered. Therefore, this cache module could be protected using different protection techniques to increase the reliability of the microprocessor.

Place, publisher, year, edition, pages
Elsevier, 2019. Vol. 71, article id 102871
Keywords [en]
LowRISCRISC-VFPGAFault injectionSoft errorSEUCharacterizationSensitivityCorrelationActivity analysisArithmetic modules
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Research subject
Physics, Electrotechnology
Identifiers
URN: urn:nbn:se:lnu:diva-88782DOI: 10.1016/j.micpro.2019.102871OAI: oai:DiVA.org:lnu-88782DiVA, id: diva2:1346460
Available from: 2019-08-28 Created: 2019-08-28 Last updated: 2019-08-29Bibliographically approved

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Mohseni, Zeynab

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  • apa
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  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
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Output format
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  • text
  • asciidoc
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