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Material damage due to electron beam during testing in the environmental scanning electron microscope (ESEM).
Linnaeus University, Faculty of Science and Engineering, School of Engineering.
Kungliga Tekniska högskolan (KTH). (Virkeslära)
2000 (English)In: Wood and Fiber Science, ISSN 0735-6161, Vol. 32, no 1, 44-51 p.Article in journal (Refereed) Published
Abstract [en]

This study describes the development of cell-wall damage, i.e., the creation of cracks across or in the vicinity of pits during the testing of twenty microtomed spruce (Picea abies karst.) samples in the Environmental Scanning Electron Microscope (ESEM). Samples were investigated both in an unloaded condition and under a constant tensile load and at different moisture levels. Regions of the moisture-cycled samples that had been exposed to an electron beam during image acquisition showed damage running through pits and their surroundings. Specimens loaded in the green condition and dried in the chamber for 2 h without beam exposure except during imaging showed no noticeable cell-wall damage. The results indicate that the electron beam may be a major source of damage initiation. Therefore, it is essential to note the circumstances of the rest when explaining the observations made in ESEM studies.

Place, publisher, year, edition, pages
2000. Vol. 32, no 1, 44-51 p.
Keyword [en]
creep, SEM
National Category
Forest Science
Research subject
Technology (byts ev till Engineering), Forestry and Wood Technology
Identifiers
URN: urn:nbn:se:lnu:diva-19081OAI: oai:DiVA.org:lnu-19081DiVA: diva2:529367
Available from: 2012-05-30 Created: 2012-05-30 Last updated: 2012-05-30Bibliographically approved

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