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Study of SiN, SiON and Mg-Si-O-N thin films by spec-troscopic elipsometry
Linnaeus University, Faculty of Technology, Department of Built Environment and Energy Technology. (Glass group)ORCID iD: 0000-0003-1430-2862
Linnaeus University, Faculty of Technology, Department of Built Environment and Energy Technology. (Glass group)ORCID iD: 0000-0002-6020-3227
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2016 (English)In: Optics and photonics conference, 2-3 November, 2016, Linköping, Sweden, 2016Conference paper, Oral presentation with published abstract (Refereed)
Place, publisher, year, edition, pages
2016.
National Category
Ceramics and Powder Metallurgical Materials
Research subject
Natural Science, Physics; Technology (byts ev till Engineering), Glass Technology
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URN: urn:nbn:se:lnu:diva-72850OAI: oai:DiVA.org:lnu-72850DiVA, id: diva2:1197844
Conference
Optics and photonics conference, 2-3 November, 2016, Linköping, Sweden
Available from: 2018-04-15 Created: 2018-04-15 Last updated: 2025-02-09Bibliographically approved

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Ali, SharafatJonson, Bo

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